The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2025
Filed:
May. 07, 2021
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Lisa Cranton Heller, Rhinebeck, NY (US);
Patrick M. West, Jr., Waukesha, WI (US);
Phil C. Yeh, Poughkeepsoe, NY (US);
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 9/455 (2018.01); G06Q 20/12 (2012.01);
U.S. Cl.
CPC ...
G06F 11/3466 (2013.01); G06F 9/45558 (2013.01); G06Q 20/1235 (2013.01); G06F 2009/45591 (2013.01); G06F 2201/815 (2013.01); G06F 2201/88 (2013.01);
Abstract
A central processing unit measurement facility is virtualized in order to support concurrent use of the facility by multiple guests executing within a virtual environment. Each guest of the environment has independent control over disablement/enablement of the facility for that guest.