The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2025

Filed:

Dec. 12, 2022
Applicant:

Aeva, Inc., Mountain View, CA (US);

Inventors:

Bruno Hexsel, Mountain View, CA (US);

Heethesh Vhavle Naresh, Sunnyvale, CA (US);

Kumar Bhargav Viswanatha, Santa Clara, CA (US);

Mina Rezk, Haymarket, VA (US);

James Reuther, San Francisco, CA (US);

Assignee:

Aeva, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 17/89 (2020.01); G01S 7/491 (2020.01); G01S 17/58 (2006.01);
U.S. Cl.
CPC ...
G01S 17/89 (2013.01); G01S 7/491 (2013.01); G01S 17/58 (2013.01);
Abstract

A method generates first points based on a first scan of an environment that includes one or more moving objects. The method transforms the first points into a first static frame, which includes removing one or more of the first points corresponding to the one or more moving objects. The method generates second points based on a second scan of the environment that includes the one or more moving objects. The method transforms the second points into a second static frame, which includes removing one or more of the second points corresponding to the one or more moving objects. The method combines the first static frame and the second static frame into an accumulated static frame, which has an increase in resolution compared with the first static frame. The method then loads the accumulated static frame into a point cloud.


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