The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2025

Filed:

Apr. 28, 2023
Applicants:

Shenzhen University, Shenzhen, CN;

Southern Marine Science and Engineering Guangdong Laboratory (Guangzhou), Guangzhou, CN;

Shenzhen Langcheng Technology Co., Ltd, Shenzhen, CN;

Inventors:

Lin Mu, Shenzhen, CN;

Daosheng Wang, Shenzhen, CN;

Yan Li, Shenzhen, CN;

Hao Qin, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 15/00 (2006.01); G01C 13/00 (2006.01); G01S 7/52 (2006.01); G01S 13/06 (2006.01); G01S 15/58 (2006.01);
U.S. Cl.
CPC ...
G01S 15/58 (2013.01); G01C 13/006 (2013.01); G01S 7/52004 (2013.01);
Abstract

A method, device, computing equipment, and storage medium for predicting the drift of the floating object are provided. A method for predicting drift velocity includes: obtaining environmental characteristic parameters at the location of the floating object to be predicted, wherein the environmental characteristic parameters include wave characteristic parameters; inputting the wave characteristic parameters into a deep learning model for wave-induced drift velocity to obtain the wave-induced drift velocity; wherein the deep learning model for wave-induced drift velocity is trained based on first sample drift data, wherein the first sample drift data includes observed drift velocity of sample floating objects, corresponding sample water surface flow characteristic parameters, sample wind characteristic parameters, and sample wave characteristic parameters.


Find Patent Forward Citations

Mu, Lin. (2025). Method, device, computing equipment, and storage medium for predicting drift velocity (U.S. Patent No. 12298390). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12298390

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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