The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2025
Filed:
Mar. 18, 2020
Hitachi High-tech Corporation, Tokyo, JP;
Misato Koike, Tokyo, JP;
Masashi Akutsu, Tokyo, JP;
Masashi Fukaya, Tokyo, JP;
Megumi Kato, Tokyo, JP;
HITACHI HIGH-TECH CORPORATION, Tokyo, JP;
Abstract
An automatic analysis apparatus includes: an automatic analysis unitwhich includes a dispensing mechanism including a probe which is configured to dispense a sample or a reagent into a reaction container, a cleaning mechanism; and a control unit. The control unit includes a storage unitconfigured to store count values which indicate weightings to contamination and are set in advance in accordance with a plurality of analysis conditions, a processing unitconfigured to obtain a cumulative count for each dispensing of the sample or the reagent on the basis of the stored count values and to determine whether the obtained cumulative count exceeds a threshold value set in advance, and an instruction unitconfigured to instruct an operation of the cleaning mechanism to clean the probe when a result of determination is that the cumulative count exceeds the threshold value.