The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2025
Filed:
Nov. 22, 2018
Applicants:
Institut National DE LA Recherche Scientifique, Quebec, CA;
Università Della Calabria, Rende CS, IT;
Inventors:
Patrizio Antici, Montreal, CA;
Marianna Barberio, Crucoli KR, IT;
Assignees:
INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE, Québec, CA;
UNIVERSITA DELLA CALABRIA, Rende, IT;
Primary Examiner:
Int. Cl.
CPC ...
H05H 15/00 (2006.01); G01N 21/31 (2006.01); G01N 23/2209 (2018.01); G01N 23/2251 (2018.01); G21K 5/00 (2006.01); H05H 3/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/2251 (2013.01); G01N 21/31 (2013.01); G01N 23/2209 (2018.02); G21K 5/00 (2013.01); H05H 3/00 (2013.01); H05H 15/00 (2013.01); G01N 2223/072 (2013.01); G01N 2223/40 (2013.01); G01N 2223/507 (2013.01);
Abstract
A system and method for stress testing a sample, the system comprising a high-intensity laser unit and a target for laser-matter interaction, wherein the high-intensity laser unit delivers an intensity of at least 10W/cmon the target, and resulting laser-accelerated particles generated by the target irradiate the sample.