The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2025
Filed:
Nov. 30, 2022
Applicant:
Samsung Display Co., Ltd., Yongin-si, KR;
Inventors:
Alexander Voronov, Suwon-si, KR;
Jooseob Ahn, Hwaseong-si, KR;
Hyeonsuk Guak, Suwon-si, KR;
Kihun Kim, Cheonan-si, KR;
Jekil Ryu, Suwon-si, KR;
Hyeongmin Ahn, Yongin-si, KR;
Assignee:
SAMSUNG DISPLAY CO., LTD., Yongin-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/94 (2006.01); G01N 21/956 (2006.01); G06T 7/521 (2017.01); G06T 7/55 (2017.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
G01N 21/94 (2013.01); G01N 21/956 (2013.01); G06T 7/521 (2017.01); G06T 7/55 (2017.01); G01N 2021/9513 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/20221 (2013.01);
Abstract
An inspection method includes irradiating a laser to an inspection target, reflecting a first emitted laser from a transmission layer included in the inspection target, reflecting a second emitted laser from a scattering layer included in the inspection target, detecting a reference image from the second emitted laser; and measuring a separation distance obtained from the first emitted laser, based on the reference image.