The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2025

Filed:

Jul. 06, 2022
Applicant:

Industrial Intelligence, Inc., Williamsburg, VA (US);

Inventors:

George T. Armbruster, Jr., Williamsburg, VA (US);

Shane Diller, Richmond, VA (US);

Bruce Seymour Ferris, Richmond, VA (US);

Laurence E. Moulis, Charlottesville, VA (US);

Viatcheslav Orlov, Richmond, VA (US);

Alan Abul-Haj, Sedona, AZ (US);

Brent Roeder, Blacksburg, VA (US);

Anthony Cosentino, Hilly Springs, NC (US);

Samuel DeFilipp, Cary, NC (US);

Assignee:

Industrial Intelligence Inc., Williamsburg, VA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/94 (2006.01); B08B 1/12 (2024.01); B08B 1/30 (2024.01); B08B 13/00 (2006.01); G01N 21/47 (2006.01); G01N 21/88 (2006.01); G06T 7/00 (2017.01); H04N 23/52 (2023.01); H04N 23/56 (2023.01);
U.S. Cl.
CPC ...
G01N 21/94 (2013.01); B08B 1/12 (2024.01); B08B 1/30 (2024.01); B08B 13/00 (2013.01); G01N 21/47 (2013.01); G01N 21/8851 (2013.01); G06T 7/0004 (2013.01); H04N 23/52 (2023.01); H04N 23/56 (2023.01);
Abstract

A continuous dust accumulation monitoring system, device and method monitors and measures dust accumulation via an enclosure and a machine vision subsystem which can include a digital camera. A dirty optics detection subsystem monitors optical clarity and can invoke a cleaning assembly to help maintain clarity of optics for monitoring and measuring dust accumulation.


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