The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2025

Filed:

Feb. 16, 2023
Applicant:

Essex Furukawa Magnet Wire Usa Llc, Atlanta, GA (US);

Inventors:

Russell Glenn Post, Fort Wayne, IN (US);

Daniel Alonso Prieto Jurado, Fort Wayne, IN (US);

Assignee:

Essex Solutions USA LLC, Atlanta, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G01N 21/952 (2006.01); H04N 23/56 (2023.01); H04N 23/90 (2023.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); G01N 21/952 (2013.01); H04N 23/56 (2023.01); H04N 23/90 (2023.01); G01N 2021/8812 (2013.01);
Abstract

A visual inspection system that may be utilized to inspect and identify defects in magnet wire or other objects is described. The system may include an outer housing, a light source, and at least one visual inspection device. The housing may include a channel through which an object to be inspected is traversed, and the channel may extend along a longitudinal direction and include an inner surface having a diameter that narrows along the longitudinal direction between a first point and an examination area. The light source may be positioned on an opposite side of the first point from the examination area along the longitudinal direction. The visual inspection device(s) may be positioned around an outer circumference of the examination area, and each visual inspection device may be configured to inspect the object through a respective opening in the housing.


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