The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2025
Filed:
Jan. 15, 2020
Quidel Corporation, San Diego, CA (US);
Andrew Attila Pal, San Diego, CA (US);
Werner Kroll, Wayland, MA (US);
Adonis Stassinopoulos, Dublin, CA (US);
Ortho-Clinical Diagnostics, Inc., Raritan, NJ (US);
Abstract
A method for performing a lateral flow assay is provided. The method includes inserting a sample cartridge () in a dark chamber () and activating a light emitter () in the dark chamber (). The method includes focusing an optical coupling mechanism () in an image-capturing device () to optimize an image of a sensitive area () in the sample cartridge () and capturing, with an image capturing device (), an image of a sensitive area () in the sample cartridge () after a selected period of time. The method also includes providing the image of the sensitive area () to a processor, wherein the processor comprises an image-capturing application (). A system and a computer-implemented method to perform at least partially the above method are also provided.