The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2025

Filed:

Feb. 18, 2022
Applicant:

Max-planck-gesellschaft Zur Foerderung Der Wissenschaften E. V., Munich, DE;

Inventors:

Mischa Bonn, Frankfurt, DE;

Maksim Grechko, Mainz, DE;

Max Lukas, Nieder-Olm, DE;

Laura Vietze, Darmstadt, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/31 (2006.01); G01J 3/453 (2006.01);
U.S. Cl.
CPC ...
G01N 21/31 (2013.01); G01J 2003/4534 (2013.01);
Abstract

A method of creating a local oscillator light beam LO for a phase-resolved spectroscopy measurement comprises the steps of providing a first measuring light beam () and a second measuring light beam () being aligned to each other, creating the local oscillator light beam LO by an optical non-linear interaction of a first portion (A) of the first measuring light beam () and a first portion (A) of the second measuring light beam () in an optical nonlinear medium (), and superimposing the local oscillator light beam LO, a second portion (B) of the first measuring light beam () and a second portion (B) of the second measuring light beam () with a predetermined mutual phase relationship, for providing a sample light beam () for the phase-resolved spectroscopy measurement. The local oscillator light beam LO and the second portions (B,B) of the first and second measuring light beams () are superimposed with a displaced Sagnac interferometer ().


Find Patent Forward Citations

Loading…