The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2025

Filed:

Sep. 27, 2022
Applicants:

Thinkcyte K.k., Tokyo, JP;

The University of Tokyo, Tokyo, JP;

Inventors:

Toru Imai, Tokyo, JP;

Sadao Ota, Tokyo, JP;

Assignees:

ThinkCyte K.K., Tokyo, JP;

The University of Tokyo, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2024.01); G01N 15/1434 (2024.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1459 (2013.01); G01N 15/1434 (2013.01); G01N 2015/1006 (2013.01); G01N 2015/144 (2013.01);
Abstract

An observation device includes an illumination optical system and an observation optical system. The illumination optical system includes a light source and an aperture member. The observation optical system includes an objective lens, an optical structure, and a detector. The optical structure is disposed at a first position which is the position conjugate with the aperture member. The optical structure includes a blocking portion that blocks light and a transmitting portion that transmits light, the blocking portion having a shape including the shape of an image of an aperture of the aperture member which is formed on the optical structure. The detector detects dark-field light passing through the optical structure.


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