The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2025

Filed:

Mar. 14, 2022
Applicant:

The Wave Talk, Inc., Daejeon, KR;

Inventors:

Young Dug Kim, Seongnam-si, KR;

Kyoung Man Cho, Seoul, KR;

Assignee:

THE WAVE TALK, INC., Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/06 (2024.01); G01N 15/075 (2024.01); G01N 21/47 (2006.01); G01N 21/51 (2006.01);
U.S. Cl.
CPC ...
G01N 15/06 (2013.01); G01N 21/4785 (2013.01); G01N 21/4788 (2013.01); G01N 15/075 (2024.01); G01N 2021/479 (2013.01); G01N 2021/516 (2013.01);
Abstract

Provided is a water examination device including: a main body; a fluid accommodation unit formed in the main body; a wave source for irradiating waves toward the fluid accommodation unit; a detector for detecting a laser speckle at every set time period that is set in advance, the laser speckle being generated due to multiple scattering of the waves in the fluid; a controller for estimating existence of impurities in the fluid in real-time by using the detected laser speckle; and a calibration unit for controlling the wave source or the detector such that an intensity of light irradiated from the wave source and measured by the detector is within a certain range set in advance.


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