The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2025

Filed:

Jan. 08, 2020
Applicant:

Haag-streit Ag, Köniz, CH;

Inventor:

Lucio Robledo, Bern, CH;

Assignee:

Haag-Streit AG, Köniz, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2022.01); A61B 3/10 (2006.01); A61B 3/107 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02 (2013.01); A61B 3/102 (2013.01); A61B 3/107 (2013.01);
Abstract

Data representing structures in an eye, in particular data for a cross-sectional image, is recorded by generating a plurality of A-scans using swept-source OCT at different locations in the eye, each of which generates a plurality of reflection values for a plurality of points along a light trace. Combined values are then calculated from several reflection values at different locations in the eye. For improving data quality, a model of at one curved structure in the eye is fitted to the reflection values, and it is then used for identifying the points on the A-scans that are to be combined. This allows to project the data along a tangential direction of the curved structures for reducing noise and for obtaining improved resolution in the direction perpendicular to the structure.


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