The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2025

Filed:

Feb. 22, 2023
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Yusuke Nagasaki, Kyoto, JP;

Masayuki Hayakawa, Kyoto, JP;

Kazuya Kimura, Kyoto, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01B 9/02001 (2022.01); G01B 9/02015 (2022.01);
U.S. Cl.
CPC ...
G01B 11/026 (2013.01); G01B 9/02007 (2013.01); G01B 9/02027 (2013.01);
Abstract

A conversion unit converts a first electrical signal to a first distance value indicating a distance from an interferometer to a measurement target. An inclination value calculation unit calculates an inclination value based on the first distance value. A first distance value correction unit corrects the first distance value based on the inclination value. A second distance value correction unit calculates a second distance value indicating a distance from the optical interference range sensor to the measurement target based on the first distance value that has been corrected by the first distance value correction unit. If the number of times that the first electrical signal is detected is smaller than a second threshold, the first distance value correction unit corrects the first distance value based on an inclination value that precedes the inclination value associated with the first distance value in a storage unit.


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