The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2025

Filed:

Jul. 21, 2022
Applicant:

At&t Intellectual Property I, L.p., Atlanta, GA (US);

Inventors:

He Yan, Berkeley Heights, NJ (US);

Ioannis Broustis, Basking Ridge, NJ (US);

Slawomir Stawiarski, Carpentersville, IL (US);

Xuan Liu, Basking Ridge, NJ (US);

Jennifer Yates, Morristown, NJ (US);

Zihui Ge, Madison, NJ (US);

Sarat Puthenpura, Berkeley Heights, NJ (US);

Giritharan Rana, Basking Ridge, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/02 (2005.12); G06N 20/00 (2018.12); H04B 17/391 (2014.12); H04L 41/14 (2021.12); H04L 41/16 (2021.12); H04L 43/0888 (2021.12); H04L 43/16 (2021.12); H04W 16/22 (2008.12); H04W 24/02 (2008.12); H04W 24/08 (2008.12); H04W 24/10 (2008.12); H04W 28/08 (2022.12); H04W 36/00 (2008.12); H04W 52/02 (2008.12); H04W 84/02 (2008.12); H04W 88/08 (2008.12); H04W 88/12 (2008.12); H04W 92/02 (2008.12); H04W 92/12 (2008.12);
U.S. Cl.
CPC ...
H04W 16/22 (2012.12); G06N 3/02 (2012.12); G06N 20/00 (2018.12); H04B 17/3912 (2015.01); H04B 17/3913 (2015.01); H04L 41/145 (2012.12); H04L 41/16 (2012.12); H04L 43/0888 (2012.12); H04L 43/16 (2012.12); H04W 24/02 (2012.12); H04W 24/08 (2012.12); H04W 24/10 (2012.12); H04W 28/0908 (2020.04); H04W 28/0917 (2020.04); H04W 28/095 (2020.04); H04W 28/0983 (2020.04); H04W 36/0083 (2012.12); H04W 52/0206 (2012.12); H04W 84/02 (2012.12); H04W 88/08 (2012.12); H04W 88/12 (2012.12); H04W 92/02 (2012.12); H04W 92/12 (2012.12); Y02D 30/70 (2020.07);
Abstract

A processing system may apply a data set comprising utilization metrics of a cells of a cell sector to a throughput prediction model to obtain a first predicted throughput for the cell sector for a designated future time period and for all cells being in an active state. The processing system may generate a first modified data set simulating a first cell being placed in an inactive state, by distributing utilization metrics of the first cell over at least one additional cell, and may apply the first modified data set to the throughput prediction model to obtain a second predicted throughput. The processing system may then determine that the second predicted throughput meets a threshold throughput that is based on the first predicted throughput, and transmit at least one instruction to place the first cell in the inactive state for the designated future time period in response to the determining.


Find Patent Forward Citations

Loading…