The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2025
Filed:
Jun. 17, 2021
Huawei Technologies Co., Ltd., Guangdong, CN;
HUAWEI TECHNOLOGIES CO., LTD., Shenzhen, CN;
Abstract
A distributed image analysis method performed by a distributed image analysis system comprising a plurality of first servers and a second server. The distributed image analysis method includes: obtaining, by each of the plurality of first servers, a result set through image collision analysis, where the result set includes an index image that records a result object, the index image corresponds to an object frequency; separately sending, by each of the plurality of first servers, a result set to the second server; performing, by the second server, feature extraction on the index image in each of the result sets received from the plurality of first servers, to obtain a feature value of the index image; performing, by the second server, image collision analysis on the extracted feature value of the index image in each of the result sets, to obtain a confidence of the index image; and when determining that a confidence between the index images in the result sets received from the plurality of first servers is greater than or equal to a preset value, obtaining, by the second server, a sum of object frequencies corresponding to the index images.