The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2025

Filed:

Apr. 20, 2022
Applicant:

Denso Corporation, Kariya, JP;

Inventors:

Naoya Ishida, Kariya, JP;

Takahiro Shidai, Kariya, JP;

Taiji Abe, Kariya, JP;

Assignee:

DENSO CORPORATION, Kariya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 9/40 (2021.12); G06F 21/55 (2012.12);
U.S. Cl.
CPC ...
H04L 63/1425 (2012.12);
Abstract

In an attack monitoring center apparatus, an event log transmitted from an attack monitoring terminal apparatus is received via a communication network. A first pattern and a second pattern are read from an event log occurrence pattern database which describes event log occurrence patterns. The first pattern is referred to in response to an abnormality being detected in the attack monitoring center apparatus; the second pattern is referred to in response to an abnormality being detected in the attack monitoring terminal apparatus. An abnormality is detected based on the event log and the first pattern. The second pattern is transmitted to the attack monitoring terminal apparatus in response to detecting the abnormality based on the event log and the first pattern.


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