The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2025

Filed:

Apr. 27, 2022
Applicant:

Nokia Technologies Oy, Espoo, FI;

Inventors:

Keeth Saliya Jayasinghe Laddu, Espoo, FI;

Qiping Zhu, Wheaton, IL (US);

Andrea Bonfante, Palaiseau, FR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 5/00 (2005.12);
U.S. Cl.
CPC ...
H04L 5/006 (2012.12); H04L 5/0048 (2012.12); H04L 5/0053 (2012.12);
Abstract

In some example embodiments, there may be provided a method that includes receiving, by a user equipment, at least a reporting configuration from a network, wherein the reporting configuration is associated with at least a first group of channel measurement resources to be measured by the user equipment and a second group of channel measurement resources for which beam indexes or beam measurements are predicted by a machine learning model comprised at the user equipment; providing, as an input to the machine learning model comprised at the user equipment, at least a first set of measurements on the first group of channel measurement resources; and reporting, to the network, channel measurement information, wherein the channel measurement information contains at least an index representing a channel measurement resource of the second group of channel measurement resources. Related systems, methods, and articles of manufacture are also disclosed.


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