The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2025

Filed:

Jul. 11, 2023
Applicant:

Lg Electronics Inc., Seoul, KR;

Inventors:

Jinyup Hwang, Seoul, KR;

Yoonoh Yang, Seoul, KR;

Sangwook Lee, Seoul, KR;

Suhwan Lim, Seoul, KR;

Manyoung Jung, Seoul, KR;

Jongkeun Park, Seoul, KR;

Assignee:

LG ELECTRONICS INC., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/345 (2014.12); H04B 17/318 (2014.12); H04W 24/10 (2008.12);
U.S. Cl.
CPC ...
H04B 17/345 (2015.01); H04B 17/318 (2015.01); H04W 24/10 (2012.12);
Abstract

A disclosure of the present specification provides a method for measuring an interference from a neighboring device. The method may performed by a device and comprise: measuring, by the device, an interference based on a reference signal from a neighboring device, which is served by a neighboring cell; and transmitting, by the device, a measurement report to a serving cell, the measurement report including a measured value of the interference. One or more steps of measuring the interference and transmitting the measurement report may be performed based on configuration information. The configuration information includes one or more of start information, end information, a timer or a threshold.


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