The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2025

Filed:

Jan. 07, 2025
Applicant:

Jiangnan University, Wuxi, CN;

Inventors:

Zhiguo Yu, Wuxi, CN;

Hai Zhou, Wuxi, CN;

Xiaoyu Zhong, Wuxi, CN;

Xiaofeng Gu, Wuxi, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03K 5/24 (2005.12); H03M 1/10 (2005.12);
U.S. Cl.
CPC ...
H03K 5/2481 (2012.12); H03K 5/249 (2012.12); H03M 1/1023 (2012.12);
Abstract

Disclosed are an offset calibration method and circuit applied to a comparator array. The offset calibration circuit includes a global calibration voltage generation module, integrators, comparators, a global logic control circuit, and local logic control circuits; an entire comparator array shares the single global calibration voltage generation module, and each of the comparators only needs to introduce an integrator circuit, such that a large calibration range and a small calibration step are achieved, a long calibration cycle and a large circuit area are required, and the requirements for a low area are satisfied. The offset calibration method provided by the present disclosure is similar to a binary search algorithm, which is adopted to search for the offset voltage, the calibration step of can be realized by only N cycles, and short calibration time is thus realized.


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