The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2025

Filed:

Aug. 30, 2022
Applicant:

Western Digital Technologies, Inc., San Jose, CA (US);

Inventors:

Eran Sharon, Rishon Lezion, IL;

Ariel Navon, Revava, IL;

Alexander Bazarsky, Holon, IL;

David Avraham, San Jose, CA (US);

Nika Yanuka, Hadera, IL;

Idan Alrod, Herzeliya, IL;

Assignee:

Sandisk Technologies, Inc., Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/00 (2005.12); G11C 11/16 (2005.12); G11C 16/08 (2005.12); G11C 16/10 (2005.12); G11C 16/14 (2005.12); G11C 16/26 (2005.12); G11C 16/34 (2005.12); G11C 29/52 (2005.12); G11C 16/04 (2005.12);
U.S. Cl.
CPC ...
G11C 16/3459 (2012.12); G11C 11/1673 (2012.12); G11C 16/08 (2012.12); G11C 16/102 (2012.12); G11C 16/14 (2012.12); G11C 16/26 (2012.12); G11C 16/3495 (2012.12); G11C 29/52 (2012.12); G11C 16/0483 (2012.12);
Abstract

A storage system has an inference engine that can infer a read threshold based on a plurality of parameters of the memory. The read threshold can be used in reading a wordline in the memory during a regular read operation or as part of an error handling process. Using this machine-learning-based approach to infer a read threshold can provide significant improvement in read threshold accuracy, which can reduce bit error rate and improve latency, throughput, power consumption, and quality of service. In another embodiment, a storage system is configured to use a binary full-depth symmetrically-sorted tree to infer a read threshold based on a plurality of parameters of the memory.


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