The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2025

Filed:

Nov. 02, 2020
Applicants:

Public University Corporation Yokohama City University, Kanagawa, JP;

Nikon Corporation, Tokyo, JP;

Inventors:

Hideki Taniguchi, Yokohama, JP;

Takanori Takebe, Yokohama, JP;

Momotaro Ishikawa, Kamakura, JP;

Masafumi Yamashita, Fujisawa, JP;

Yasujiro Kiyota, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2016.12); C12M 1/34 (2005.12);
U.S. Cl.
CPC ...
G06T 7/0016 (2012.12); C12M 41/46 (2012.12); G06T 2207/30004 (2012.12);
Abstract

A cell evaluation method includes acquiring a first evaluation index and a first index calculated using the first evaluation index with respect to comparative target cells in a culture process including a cell differentiation-inducing process in which cell differentiation is induced, calculating a second index on the basis of the first evaluation index with respect to evaluation target cells different from the comparative target cells, and evaluating differentiation of the evaluation target cells by comparing the first index with the second index.


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