The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2025
Filed:
Aug. 24, 2022
Canon Kabushiki Kaisha, Tokyo, JP;
Kenichirou Haruta, Chiba, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An inspection apparatus obtains a scanned image by reading a printed product, calculates a weighting factor of a weighting filter based on a difference between a value of a pixel of interest in a reference image used in creation of the printed product and values of peripheral pixels of the pixel of interest, performs filter processing by using the weighting filter having the weighting factors, with respect to a pixel of interest in the scanned image, which corresponds to the pixel of interest in the reference image, thereby shifting the pixel of interest in the scanned image, and create an inspection target image by calculating the weighting factors and performing the filter processing with respect to the shifted pixel of interest, and inspects quality of the printed product by collating the inspection target image with the reference image.