The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2025
Filed:
Mar. 30, 2022
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Masatoshi Ishii, Tokyo, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2016.12); G06T 7/13 (2016.12);
U.S. Cl.
CPC ...
G06T 7/001 (2012.12); G06T 7/0008 (2012.12); G06T 7/13 (2016.12); G06T 2207/20212 (2012.12); G06T 2207/30144 (2012.12);
Abstract
An image processing apparatus is configured to determine presence or absence of print abnormality in a target image by comparing a reference image or reference images, each of which is a print result to be a reference, and the target image, which is a print result to be an inspection target. The image processing apparatus includes a setting unit configured to set an inspection condition for a printed product, and a comparison unit configured to compare the reference image or reference images and the target image using a number of the reference images set based on the inspection condition.