The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2025
Filed:
Mar. 24, 2022
Canon Kabushiki Kaisha, Tokyo, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
An evaluation apparatus that evaluates a composition formed on a substrate by forming processing is provided. The apparatus comprises an obtaining device that obtains an image including the composition by the forming processing, and a processing device that processes the image for the evaluation. The processing device outputs a feature of each of one or more abnormalities in the image according to an inference model, obtains information regarding a formation region on the substrate where the composition has been formed, determines the kind of each of the abnormalities based on the output feature of each of the abnormalities and a relationship between the information and a position and a size of the abnormality, and makes, based on a result of the determination, final determination as to whether the image is a normal image or an image including an abnormality.