The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2025
Filed:
Feb. 23, 2022
The Boeing Company, Chicago, IL (US);
Xue Liu, Maryland Heights, MO (US);
David J. Sundquist, O'Fallon, MO (US);
Matthew Mark Thomas, Maryland Heights, MO (US);
Steven M. Volz, Alton, IL (US);
Hui Lin Yang, Derwood, MD (US);
The Boeing Company, Arlington, VA (US);
Abstract
A method is provided for measuring and quantifying optical distortion of a transparent object using a single image. Embodiments provided herein include a method including: receiving an image of an object and a transparent object, where the object is visible through the transparent object, where a portion of the image of the object is visible through the transparent object is an inside region of interest (iROI), where a portion of the image of the object not viewed through the transparent object is an outside region of interest (oROI); determining measured pixel locations for a plurality of identified pixels in the image, the plurality of identified pixels corresponding to the distinct points in the image; calculating virtual locations in the image representing the distinct points within the iROI; determining, for respective distinct points within the iROI, differences between the virtual location and the measured pixel location.