The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2025

Filed:

Mar. 31, 2021
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Christopher Sidler, Bethesda, MD (US);

Raymond Strecker, Jersey City, NJ (US);

Michael A Dawson, Washington, DC (US);

Sankar Virdhagriswaran, Boxborough, MA (US);

Jon E Elvin, Gibsonia, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 30/018 (2022.12); G06F 16/28 (2018.12); G06N 20/00 (2018.12);
U.S. Cl.
CPC ...
G06Q 30/0185 (2012.12); G06F 16/285 (2018.12); G06N 20/00 (2018.12);
Abstract

Monitoring transaction activity for system requests for a set of entities authorized to request services of a system is described. Entities with high feature values for respective features of the set of activity based features are identified to produce a set of outlier entities. The outlier entities are filtered from the set of entities. A set of clusters are created from the filtered set of entities based on the set of activity based features so that each entity in the filtered set of entities is assigned to a cluster. Values for the set of activity based features are established for each cluster. A risk is assigned for each cluster based on the values of one or more of the set of activity based features. Each of the filtered set of entities are monitored based on the risk assigned to the respective clusters to which the respective entities belong.


Find Patent Forward Citations

Sidler, Christopher. (2025). Risk clustering and segmentation (U.S. Patent No. 12293377). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12293377

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…