The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2025

Filed:

Jan. 07, 2022
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Parminder Singh Sethi, Ludhiana, IN;

Shelesh Chopra, Bangalore, IN;

Kanika Kapish, Muzaffarnagar, IN;

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 8/65 (2017.12); G06F 8/61 (2017.12); G06F 9/455 (2017.12);
U.S. Cl.
CPC ...
G06F 8/65 (2012.12); G06F 8/61 (2012.12); G06F 9/45558 (2012.12); G06F 2009/45591 (2012.12);
Abstract

A method and system for version history based upgrade testing across simulated information technology (IT) environments. At least with respect to computing, an upgrade may entail the replacement of a product—in the form of hardware, software, and/or firmware—with a newer or better version, which may serve to bring the product up to date, improve the characteristic(s) of the product, and/or resolve any issue(s) inflicting the product. Further, through the process of upgrade testing, an upgrade may be assessed to determine its impact on an operability of varying environments following application of the upgrade thereon. The disclosed method and system, accordingly, propose a framework directed to conducting upgrade tests within simulated IT environments—each reflective of different computing resources and upgrade histories—where results of the simulations may be examined to ascertain which environment configurations (if any) may cause the tested upgrade to fail.


Find Patent Forward Citations

Loading…