The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2025

Filed:

Oct. 28, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Yuto Hayaki, Tokyo, JP;

Norio Yamagaki, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 8/41 (2017.12); G06F 21/54 (2012.12);
U.S. Cl.
CPC ...
G06F 8/433 (2012.12); G06F 21/54 (2012.12); G06F 2221/033 (2012.12);
Abstract

A device inputs a first source code, which is source code of the software to be monitored; builds the first source code to generate a first binary; generates a first CFG based on the first binary; embeds a tamper detection feature and tamper detection feature calling functions in a first source code based on the first CFG to generate a second source code, builds a second source code to generate a second binary; generates a second CFG based on the second binary; creates an allowed list based on the second binary and the second CFG, and outputs the second binary and the allowed list. Here, in creating the allowed list, the monitoring range for the tamper detection feature calling functions is determined based on the second CFG, and a list of hash values of the monitoring range for the tamper detection feature calling functions is created as an allowed list.


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