The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2025

Filed:

Nov. 07, 2023
Applicant:

Htc Corporation, Taoyuan, TW;

Inventors:

Chen-Han Tsai, Taoyuan, TW;

Yu-Shao Peng, Taoyuan, TW;

Assignee:

HTC Corporation, Taoyuan, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/55 (2018.12); G06F 18/241 (2022.12);
U.S. Cl.
CPC ...
G06F 16/55 (2018.12); G06F 18/241 (2022.12);
Abstract

A data classification method, for classifying unlabeled images into an inlier data set or an outlier data set, include following steps. The unlabeled images are obtained. An assigned inlier image is selected among the unlabeled images. A similarity matrix is computed and the similarity matrix includes first similarity scores of the unlabeled images relative to the assigned inlier image. Each of the unlabeled images is classified into an inlier data set or an outlier data set according to the similarity matrix, so as to generate inlier-outlier predictions of the unlabeled images.


Find Patent Forward Citations

Tsai, Chen-Han. (2025). Data classification method for classifying inlier and outlier data (U.S. Patent No. 12292919). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12292919

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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