The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2025

Filed:

Jan. 20, 2022
Applicant:

Oracle International Corporation, Redwood Shores, CA (US);

Inventors:

John Mark Beresniewicz, Half Moon Bay, CA (US);

Kusumaharanadh Poduri, Mountain House, CA (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/245 (2018.12); G06F 11/30 (2005.12); G06F 11/34 (2005.12); G06F 16/2453 (2018.12);
U.S. Cl.
CPC ...
G06F 16/24542 (2018.12); G06F 11/3075 (2012.12); G06F 11/3419 (2012.12);
Abstract

Techniques are described herein for probabilistic monitoring of high-frequency, low-latency database queries. In some embodiments, a probabilistic query monitoring system periodically samples active database sessions. For example, the system may generate sample data every one second or at some other sampling rate for each database session that is currently active. The sample data may include a mapping between query identifiers to sample counter values that are extracted at different sample intervals. The system may then estimate performance metrics for the set of active database based on the counter values sampled across consecutive sample intervals.


Find Patent Forward Citations

Loading…