The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2025
Filed:
Feb. 09, 2023
International Business Machines Corporation, Armonk, NY (US);
Daniel S. Critchley, Winchester, GB;
Roderick Guy Charles Moore, Bournemouth, GB;
Tim McCarthy, Eastleigh, GB;
Jonathan William Lewis Short, Eastleigh, GB;
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A method, computer program product, and computer system are provided for testing drives in a redundant array of independent disks (RAID) array. The method includes: mirroring data from a selected drive to be tested in a RAID array to spare storage space in the RAID array; and, once the data is successfully mirrored, testing the selected drive to identify a preemptive failure of the selected drive. The RAID may be a traditional RAID (TRAID) array and the spare space may be a spare physical drive independent of array drive members. The RAID array may alternatively be a distributed RAID (DRAID) array and the spare space may be spare capacity spread through the array drive members.