The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2025
Filed:
Aug. 09, 2021
Applicant:
Lightoptech Corp., West Henrietta, NY (US);
Inventors:
Eric L. Buckland, Hickory, NC (US);
Cristina Canavesi, West Henrietta, NY (US);
Assignee:
LighTopTech Corp., West Henrietta, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2005.12); G01B 9/02091 (2021.12); G02B 7/14 (2020.12); G02B 7/16 (2020.12); G02B 21/36 (2005.12);
U.S. Cl.
CPC ...
G02B 21/0056 (2012.12); G01B 9/02091 (2012.12); G02B 7/14 (2012.12); G02B 7/16 (2012.12); G02B 21/361 (2012.12);
Abstract
A low-coherence interferometry imaging system for imaging translucent samples, wherein the system includes an optical coherence microscopy (OCM) mode and an optical coherence tomography (OCT) mode, and wherein the system can selectively employ either mode without requiring re-positioning of a sample under test. The system provides for the selective disposition of the OCM mode or the OCT mode in an optical path intermediate a scanning system and an imaging objective.