The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2025

Filed:

Dec. 25, 2022
Applicants:

The First Institute of Oceanography, Mnr, Qingdao, CN;

Qingdao National Laboratory of Marine Science and Technology Development Center, Qingdao, CN;

Inventors:

Shijuan Yan, Qingdao, CN;

Xinyu Shi, Qingdao, CN;

Chuanshun Li, Qingdao, CN;

Jun Ye, Qingdao, CN;

Gang Yang, Qingdao, CN;

Zhiwei Zhu, Qingdao, CN;

Yue Hao, Qingdao, CN;

Dewen Du, Qingdao, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 1/38 (2005.12); G06F 18/22 (2022.12);
U.S. Cl.
CPC ...
G01V 1/3817 (2012.12); G01V 1/3808 (2012.12); G06F 18/22 (2022.12);
Abstract

A method and system for positioning and correcting visual data by seafloor topographic profiles are provided. The method includes: offsetting the water-depth profile of the target survey line equidistantly in a grid layer of a target area to make profiles generated after the offsetting traverse the grid layer of the target area, and obtaining offset data sequences corresponding to the water-depth profile of the target survey line; drawing offset topographic profiles based on offset data of the offset data sequences corresponding to the water-depth profile of the target survey line; calculating a profile similarity between the water-depth profile of the target survey line and each of the offset topographic profiles by using a dynamic time warping (DTW) algorithm; and selecting a geographic location of one of the offset topographic profiles with a largest profile similarity as an actual geographic location of a water-depth profile of a seafloor visual survey line.


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