The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2025
Filed:
Jul. 09, 2021
Koninklijke Philips N.v., Eindhoven, NL;
Steffen Weiss, Hamburg, DE;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
For the field of determining the position of an invasive device () a solution for improving the localization of the invasive device () is specified. This is achieved by an arrangement and a method for determining the position of an invasive device (), wherein an optical shape sensing system for sensing a position and/or shape of the invasive device () is provided, wherein the system is arranged to localize at least one point Pon the invasive device () at a position x, y, z, with some error margin (ΔxΔyΔz) in a region of interest (), localizing and reconstructing at least one point Pon the invasive device () at a position x, y, z, with some error margin (ΔxΔyΔz) in a region of interest () by the optical shape sensing system. An MRI system is also provided for measuring the position x, y, zof the point Pon the invasive device () within the error margin in the region of interest at least in one spatial direction by the MRI system, wherein a signal of the magnetization in the error margin (ΔxΔyΔz) is read out by the MRI system and a position of the invasive device () is determined based on the signal. The position x, y, z, of the point Pon the invasive device () in the region of interest () determined by the optical shape sensing system is corrected with the x, y, z, of the point Pon the invasive device () in the region of interest () determined by the MRI system by a calculating system to an actual position of the point Pon the invasive device ().