The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2025

Filed:

Oct. 31, 2018
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Takeshi Ishida, Tokyo, JP;

Yoshihiro Yamashita, Tokyo, JP;

Hisashi Yabutani, Tokyo, JP;

Koshin Hamasaki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2005.12);
U.S. Cl.
CPC ...
G01N 35/00663 (2012.12); G01N 2035/00673 (2012.12);
Abstract

The object of the invention is to provide an automatic analysis apparatus which is capable of both sterilizing a reagent and suppressing property variations in the reagent. Provided is an automatic analysis apparatus including a reagent vessel which holds a reagent; a suction nozzle which sucks the reagent; an analysis unit which executes an analysis operation by adding a reagent sucked from the reagent vessel to a specimen via the suction nozzle; an ultraviolet ray source which sterilizes a reagent by ultraviolet irradiation; and an electrode or a substrate which supplies electric power to the ultraviolet ray source, in which a heat insulation portion is arranged between a reagent in the suction nozzle and the ultraviolet ray source and the electrode or the substrate, or, it is isolated between a reagent in the suction nozzle and the ultraviolet ray source and the electrode or the substrate.


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