The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2025

Filed:

Feb. 08, 2023
Applicant:

Baker Hughes Holdings Llc, Houston, TX (US);

Inventor:

Alexander Suppes, Garbsen, DE;

Assignee:

Baker Hughes Holdings LLC, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/046 (2017.12); H01M 50/105 (2020.12);
U.S. Cl.
CPC ...
G01N 23/046 (2012.12); H01M 50/105 (2020.12); G01N 2223/303 (2012.12); G01N 2223/304 (2012.12); G01N 2223/611 (2012.12);
Abstract

A system and method for calibrating a computed tomography (CT) scanner including scanning a calibration apparatus with the CT scanner, and determining a first scan edge of a first calibration layer, a second scan edge of a second calibration layer, and a floating point of an opening from the scan. The method also includes determining a first scan dimension and second scan dimension measured in the longitudinal direction from the first scan edge to the floating point, and the second scan edge to the floating point, respectively. The method also includes determining a first scan overhang based on a difference between the first scan dimension and the second scan dimension and comparing the first scan overhang to the calibration overhang. The method also includes determining a first level of uncertainty for the CT scanner based on the comparing.


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