The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2025
Filed:
Jul. 07, 2021
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Takahiro Doki, Kyoto, JP;
Kenji Kimura, Kyoto, JP;
Taro Shirai, Kyoto, JP;
Naoki Morimoto, Kyoto, JP;
Assignee:
Shimadzu Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/041 (2017.12);
U.S. Cl.
CPC ...
G01N 23/041 (2018.01); G01N 2223/401 (2012.12);
Abstract
An X-ray phase imaging apparatus includes an X-ray source; an X-ray detector; a plurality of gratings; a subject holder arranged in an X-ray irradiation area and configured to hold the subject; and an image processor configured to generate an X-ray phase contrast image based on an intensity distribution of the X-rays detected by the X-ray detector. The subject holder is formed of a first material having an X-ray transmittance greater than metal and a scattering degree smaller than the metal.