The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2025
Filed:
Feb. 16, 2021
Applicant:
Nec Corporation, Tokyo, JP;
Inventors:
Chisato Sugawara, Tokyo, JP;
Kazuki Inagaki, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2005.12);
U.S. Cl.
CPC ...
G01N 21/8851 (2012.12); G01N 2021/8854 (2012.12); G01N 2021/8877 (2012.12); G01N 2021/8887 (2012.12); G01N 2223/614 (2012.12);
Abstract
A deterioration diagnosis device according to an example aspect of the present invention includes: a memory; and at least one processor coupled to the memory. The processor performs operations. The operations include: acquiring an image including a portion to be diagnosed in a structure; calculating, by using the image, deterioration degree that is a degree of deterioration of the portion; calculating reliability for the deterioration degree based on imaging information that is information related to capturing of the image; and outputting the deterioration degree and the reliability in association with each other.