The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2025

Filed:

May. 10, 2024
Applicant:

Divergent Technologies, Inc., Los Angeles, CA (US);

Inventors:

Vivek R. Dave, Concord, NH (US);

Mark J. Cola, Santa Fe, NM (US);

R. Bruce Madigan, Butte, MT (US);

Alberto Castro, Santa Fe, NM (US);

Glenn Wikle, Santa Fe, NM (US);

Lars Jacquemetton, Santa Fe, NM (US);

Peter Campbell, Albuquerque, NM (US);

Assignee:

Divergent Technologies, Inc., Los Angeles, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/71 (2005.12); B33Y 30/00 (2014.12); B33Y 50/00 (2014.12); G01N 21/00 (2005.12); H01L 21/66 (2005.12); G01N 21/84 (2005.12); G06N 20/00 (2018.12);
U.S. Cl.
CPC ...
G01N 21/71 (2012.12); B33Y 30/00 (2014.11); B33Y 50/00 (2014.11); G01N 21/00 (2012.12); H01L 22/12 (2012.12); G01N 2021/8411 (2012.12); G06N 20/00 (2018.12);
Abstract

This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.


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