The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2025

Filed:

Sep. 20, 2019
Applicants:

Mitsubishi Heavy Industries, Ltd., Tokyo, JP;

Akita University, Akita, JP;

Inventors:

Nobuyuki Kamihara, Tokyo, JP;

Naomoto Ishikawa, Tokyo, JP;

Kiyoka Takagi, Tokyo, JP;

Sota Kamo, Tokyo, JP;

Makoto Yamaguchi, Akita, JP;

Mitsutoshi Jikei, Akita, JP;

Kazuya Matsumoto, Akita, JP;

Mikio Muraoka, Akita, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/65 (2005.12); B29C 71/00 (2005.12); B29C 71/02 (2005.12); B29K 101/12 (2005.12); G01N 33/44 (2005.12);
U.S. Cl.
CPC ...
G01N 21/65 (2012.12); B29C 71/0063 (2012.12); B29C 71/02 (2012.12); G01N 33/442 (2012.12); B29K 2101/12 (2012.12); B29K 2995/0041 (2012.12);
Abstract

A crystallinity measurement device includes a Raman spectroscopy unit configured to acquire a Raman spectrum of resin-containing material including crystalline thermoplastic resin; and an analysis unit configured to calculate crystallinity of the crystalline thermoplastic resin based on an intensity of a low-wavenumber spectrum that is a spectrum in a region of less than 600 cm, in the Raman spectrum.


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