The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2025

Filed:

Nov. 21, 2022
Applicant:

Topcon Corporation, Tokyo, JP;

Inventor:

Takeshi Kikuchi, Tokyo, JP;

Assignee:

TOPCON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 15/00 (2005.12); G06T 19/00 (2010.12);
U.S. Cl.
CPC ...
G01C 15/002 (2012.12); G06T 19/006 (2012.12);
Abstract

Provided is a survey assistance system including a measuring instrument; an eyewear display device including a display; and at least one processor configured to synchronize a coordinate space of the eyewear display device, a coordinate space of the measuring instrument, and a coordinate space of an absolute coordinate system and displays an image in the absolute coordinate system created by the processor on the display with superimposing the image on a site landscape. The processor is configured to read out survey process data, create a work assistance image based on the survey process data, and enable observation of the work assistance image including the instrument installation points and images of the surveying instrument to be used showing installed states at the instrument installation points by superimposing the work assistance image on the site landscape.


Find Patent Forward Citations

Loading…