The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2025

Filed:

Mar. 01, 2021
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventor:

Yoshitsugu Ogawa, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
F16P 3/08 (2005.12); B23Q 11/08 (2005.12); B23Q 17/00 (2005.12); H01H 3/16 (2005.12);
U.S. Cl.
CPC ...
F16P 3/08 (2012.12); B23Q 11/0891 (2012.12); B23Q 17/007 (2012.12); H01H 3/163 (2012.12);
Abstract

A machine tool includes: a door that opens and closes an opening in a shield cover surrounding a machining chamber; an electromagnetic lock device that includes dual-system switches that detect an open/closed state of the door, and that can lock the door in a closed state; a door position detection unit that detects a position of the door; and a report unit that monitors states of the dual-system switches of the electromagnetic lock device and suggests maintenance of the door when the states differ from each other for a predetermined period of time and when the door position detection unit detects that the door is not in a closed position.


Find Patent Forward Citations

Ogawa, Yoshitsugu. (2025). Machine tool and machine tool system (U.S. Patent No. 12292161). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12292161

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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