The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2025

Filed:

Jan. 28, 2022
Applicant:

Symeo Gmbh, Neubiberg, DE;

Inventors:

Johannes Traa, Medford, MA (US);

Andrew Schweitzer, Cambridge, MA (US);

Atulya Yellepeddi, Medford, MA (US);

Assignee:

Symeo GmbH, Neubiberg, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B60W 60/00 (2019.12);
U.S. Cl.
CPC ...
B60W 60/001 (2020.01); B60W 2420/408 (2023.12); B60W 2554/4041 (2020.01); B60W 2554/4048 (2020.01); B60W 2554/4049 (2020.01);
Abstract

A method includes an operation to collect radar signals reflected from objects in a field of view. Range-angle-doppler bins representing three-dimensional objects in the field of view are formed. A local median operation is used across a selected dimension of the range-angle-doppler bins to eliminate background noise in the range-angle-doppler bins. Low energy peak regions are masked by removing radial velocity values in the selected dimension to form a sparse range-angle two-dimensional grid. The radar signals reflected from objects in the view of view are processed to extract reflection point detections. Reflection point detections are tracked in accordance with short-term filter rules to form tracked reflection point detections. The tracked reflection point detections are formed into clusters. The clusters are processed with long-term filter rules.


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