The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2025
Filed:
Oct. 24, 2022
Nvidia Corporation, Santa Clara, CA (US);
Anitha Kalva, San Jose, CA (US);
Jae Wu, Los Gatos, CA (US);
Shantanu Sarangi, Saratoga, CA (US);
Sailendra Chadalavada, Saratoga, CA (US);
Milind Sonawane, Santa Clara, CA (US);
Chen Fang, Shanghai, CN;
Abilash Nerallapally, Newark, CA (US);
NVIDIA CORPORATION, Santa Clara, CA (US);
Abstract
Systems and methods are disclosed that relate to testing processing elements of an integrated processing system. A first system test may be performed on a first processing element of an integrated processing system. The first system test may be based at least on accessing a test node associated with the first processing element. The first system test may be accessed using a first local test controller. A second system test may be performed on a second processing element of the integrated processing system. The second system test may be based at least on accessing a second test node associated with the second processing element. The second system test may be accessed using a second local test controller.