The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2025

Filed:

Mar. 31, 2023
Applicant:

Jumio Corporation, Sunnyvale, CA (US);

Inventors:

Stuart Wells, Saratoga, CA (US);

Attila Balogh, Vienna, AT;

Anshuman Vikram Singh, Vienna, AT;

Thomas Krump, Buchkirken, AT;

Daryl Huff, Saratoga, CA (US);

Assignee:

Jumio Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B42D 25/333 (2013.12); G06T 5/50 (2005.12); G06T 7/13 (2016.12); G06V 30/414 (2021.12);
U.S. Cl.
CPC ...
B42D 25/333 (2014.09); G06T 5/50 (2012.12); G06T 7/13 (2016.12); G06V 30/414 (2021.12); G06T 2207/20221 (2012.12);
Abstract

The disclosure includes a system and method for obtaining at least one image of a document under test, wherein valid instances of the document under test include at least one three-dimensional security feature; obtaining a first image snippet from the document under test, the first image snippet corresponding to at least a first portion of the three-dimensional security feature present in the valid instances of the document; deriving first dimensional data associated with the first image snippet; analyzing the first dimensional data to determine one or more of: whether the first dimensional data is consistent with a presence of the three-dimensional security feature, and whether the first dimensional data is consistent with second dimensional data; and modifying a likelihood that the document under test is accepted as valid, or rejected as invalid, based on the analysis of the first dimensional data.


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