The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2025
Filed:
Mar. 18, 2020
Health Tech Connex Inc., Surrey, CA;
Ryan Clarke Newell D'Arcy, North Vancouver, CA;
Fabio Bollinger, Langley, CA;
Shaun Dean Fickling, Coquitlam, CA;
Zachary Frehlick, Vancouver, CA;
Sujoy Ghosh Hajra, Ottawa, CA;
Sunny Gurm, Burnaby, CA;
Nazanin Hamzei, Vancouver, CA;
Caressa Chang Liu, North York, CA;
Ashley Candice Livingstone, Coquitlam, CA;
Christopher James Smith, Abbotsford, CA;
Pamela Tannouri, Burnaby, CA;
Mike Thiem, Calgary, CA;
Evangeline Yee, Coquitlam, CA;
Shaquile Ryan Nijjer, Surrey, CA;
HEALTH TECH CONNEX INC., Surrey, CA;
Abstract
A system and method is operable to automatically determine the amplitude and latency of one or more evoked potential (EP) or event-related potential (ERP) from electroencephalography (EEG) data. The EEG data from an EEG scan is separated into one or more epochs containing the desired EP or ERP waveforms. Epochs corresponding to the same type of EP or ERP such as N100, P300, and N400 are averaged automatically. The averaged epochs are automatically filtered in the time-frequency domain using an automatically selected filtering mask associated with the type of EP or ERP. A corresponding peak is automatically identified from the filtered epoch, in which the amplitude and latency is automatically measured.