The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 2025
Filed:
Mar. 31, 2020
Chengdu Boe Optoelectronics Technology Co., Ltd., Sichuan, CN;
Boe Technology Group Co., Ltd., Beijing, CN;
Jiping Zhao, Beijing, CN;
Mengmeng Du, Beijing, CN;
Xiangdan Dong, Beijing, CN;
Hongwei Ma, Beijing, CN;
CHENGDU BOE OPTOELECTRONICS TECHNOLOGY CO., LTD., Sichuan, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
Abstract
A display substrate and a test method thereof are disclosed. The display substrate includes a base substrate, data lines, data leads, a first test circuit and a second test circuit. A display region of the base substrate includes a pixel array, and the pixel array includes a plurality of sub-pixels; the first test circuit is configured to apply a first test signal to the plurality of sub-pixels to perform a first test in a first test stage; the second test circuit is configured to apply a second test signal to the plurality of sub-pixels to perform a second test in a second test stage. The first test circuit includes a first test switch circuit and a first test control signal application circuit, a first test control signal pad and a first test control signal bypass are respectively electrically connected to a control terminal of the first test switch circuit.