The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2025

Filed:

Feb. 05, 2021
Applicant:

Ams-osram International Gmbh, Regensburg, DE;

Inventors:

Massimo Cataldo Mazzillo, Hamburg, DE;

Wolfgang Zinkl, Tegernheim, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10F 77/30 (2024.12); G01S 7/481 (2005.12); G01S 7/4865 (2019.12); G01S 17/894 (2019.12); G02B 5/20 (2005.12); G02B 27/14 (2005.12); H10F 30/21 (2024.12); H10F 30/225 (2024.12); H10F 77/00 (2024.12); G02B 5/28 (2005.12);
U.S. Cl.
CPC ...
H10F 77/337 (2024.12); G01S 7/4814 (2012.12); G01S 7/4816 (2012.12); G01S 7/4817 (2012.12); G01S 7/4865 (2012.12); G01S 17/894 (2019.12); G02B 5/207 (2012.12); G02B 5/208 (2012.12); G02B 27/14 (2012.12); H10F 30/225 (2024.12); H10F 30/288 (2024.12); H10F 77/331 (2024.12); H10F 77/959 (2024.12); G02B 5/28 (2012.12);
Abstract

An integrated photodetecting semiconductor optoelectronic component for measuring the intensity of each of the two colour constituents of dichromatic light irradiating the optoelectronic component includes a first SPAD and a second SPAD that detect photons over a broad range of wavelengths. The component also includes a semiconductor optical longpass filter that at least partially covers an active surface area of the first SPAD. The longpass filter is permissive to a first one of the two colour constituents of the dichromatic light and blocking the second one of the two colour constituents of the dichromatic light. The component further includes electronic circuitry for the readout and processing of detection signals delivered by the first and second SPAD. The electronic circuitry is adapted to provide a first intensity output signal and a second intensity output signal via a differential analysis based on the detection signals delivered by the first and second SPAD.


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