The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2025

Filed:

Dec. 17, 2021
Applicant:

Innoscience (Suzhou) Technology Co., Ltd., Suzhou, CN;

Inventors:

Chao Yang, Suzhou, CN;

Chunhua Zhou, Suzhou, CN;

Yong Liu, Suzhou, CN;

Qiyue Zhao, Suzhou, CN;

Jingyu Shen, Suzhou, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10D 30/01 (2024.12); H10D 30/47 (2024.12); H10D 62/85 (2024.12); H10D 64/27 (2024.12);
U.S. Cl.
CPC ...
H10D 30/015 (2024.12); H10D 30/475 (2024.12); H10D 30/477 (2024.12); H10D 62/8503 (2024.12); H10D 64/513 (2024.12);
Abstract

A nitride-based semiconductor device includes a first nitride-based semiconductor layer, a second nitride-based semiconductor layer, a third nitride-based semiconductor layer, a passivation layer, a gate insulator layer, and a gate electrode. The first nitride-based semiconductor layer includes at least two doped barrier regions defining an aperture between the doped barrier regions. The second nitride-based semiconductor layer is disposed over first nitride-based semiconductor layer. The third nitride-based semiconductor layer is disposed on the second nitride-based semiconductor layer and has a bandgap higher than a bandgap of the second nitride-based semiconductor layer. The passivation layer is disposed over the third nitride-based semiconductor layer, in which a vertical projection of the passivation layer on the first nitride-based semiconductor layer is spaced apart from the aperture. The gate insulator layer is disposed over the third nitride-based semiconductor layer. The gate electrode is disposed over the gate insulator layer and aligns with the aperture.


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